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Language: en
Pages: 313
Pages: 313
Type: BOOK - Published: 2006-05-17 - Publisher: Springer Science & Business Media
This monograph, divided into four parts, presents a comprehensive treatment and systematic examination of cycle spaces of flag domains. Assuming only a basic fa
Language: en
Pages: 394
Pages: 394
Type: BOOK - Published: 2010-08-23 - Publisher: Springer
This book contains extended and revised versions of the best papers presented during the fourteenth IFIP TC 10/WG 10.5 International Conference on Very Large Sc
Language: en
Pages: 190
Pages: 190
Type: BOOK - Published: 2012-09-25 - Publisher: Springer
This book contains extended and revised versions of the best papers presented at the 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integra
Language: en
Pages: 235
Pages: 235
Type: BOOK - Published: 2013-11-26 - Publisher: Springer
This book contains extended and revised versions of the best papers presented at the 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integra
Language: en
Pages: 233
Pages: 233
Type: BOOK - Published: 2017-08-31 - Publisher: Springer
This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integra
Language: en
Pages: 344
Pages: 344
Type: BOOK - Published: 2007-10-01 - Publisher: Springer
This book contains extended and revised versions of the best papers that were presented during the thirteenth edition of the IFIP TC 10 International Conference
Language: en
Pages: 290
Pages: 290
Type: BOOK - Published: 2009-04-13 - Publisher: Springer Science & Business Media
This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Confe
Language: en
Pages: 281
Pages: 281
Type: BOOK - Published: 2019-06-25 - Publisher: Springer
This book contains extended and revised versions of the best papers presented at the 26th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integra
Language: en
Pages: 477
Pages: 477
Type: BOOK - Published: 2002-07-31 - Publisher: Springer Science & Business Media
The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was abou
Language: en
Pages: 388
Pages: 388
Type: BOOK - Published: 2006-03-30 - Publisher: Springer Science & Business Media
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing,